LBNL-UCO/Lick high-resistivity CCD's
Optical properties of silicon, fused quartz, and indium-tin oxide

See the SPIE 99 paper for full documentation and references

1. Optical constants of silicon at 300 K

A picture goes here Left: real and imaginary parts of refractive index for crystaline silicon.
Click on figure for large postscript version (56 kbytes)

Postscript figure of optical absorption length in Si at room temperature (48 kbytes)

Postscript figure from SPIE paper, showing absorption length and index of refraction (82 kbytes)

Text file of n, k, and absorption length as a function of lambda and photon energy


2. Temperature dependence of silicon absorption length

A picture goes here Click on figure for large postscript version (58 kbytes)

Text file listing absorption length in silicon as a function of wavelength for T = 77 K, 153 K (-120 C), 173 K (-100 C), and 300 K as calculated from the parameterization of Rajkanan, Singh, and Shewchun, Solid-State Electronics 22, 793 (1979)

IDL procedure used to calculate the text file and figure data.


3. Index of refraction of fused quartz

A picture goes here Click on figure for large postscript version (41 kbytes)

Blue crosses are from measurements given in Jenkins & White. Dashed green line is from a measurement on a sputtered SiO_2 film.

Text file of IDL commands to generate the index as a function of wavelength (red curve)


4. Index of refraction of indium-tin oxide

A picture goes here Click on figure for large postscript version (46 kbytes)
or here for a pdf version.

Red curve uses functional form of Gerfin & Graetzel to smooth data of Wollam, McGahan, & Johs. It is our best estimate, and the only one with data extending into the red. Curves A, B, and C reflect sample-to-sample differences of this somewhat variable material

Text file of the index shown in red as a function of wavelength; table includes absorptive part


Don Groom

28-Dec-98